IEC 61032 Figure 12 Test Probe 18 and IEC 61032 Figure 13 Test Probe 19 SC-F1218 SC-F1319

SC-F1218

SC-F1319

 IEC 61032 Figure 12 Test Probe 18 and IEC 61032 Figure 13 Test Probe 19

Product overview

The IEC 61032 Small Finger Probe (Test Probe 18 & 19) is a child-specific safety tool designed to test if equipment openings block access to hazardous parts by infants (0–36 months) and young children (37–96 months). It features two articulated probes: Probe 18 (mimicking 3–8-year-olds’ fingers) and Probe 19 (simulating infants’ smaller digits), with flexible joints that replicate natural hand movements. Crafted from conductive metal (for detecting live parts) and paired with insulated handles, it applies a gentle 10N thrust to mimic curious child contact. Strictly compliant with IEC 61032, it’s critical for manufacturers of child-accessible devices to prevent injuries and meet global safety rules.

Specifications

• Parameter
• Test Probe 18 (37–96 Months Children)
• Test Probe 19 (0–36 Months Infants)
• Probe Type
• Child finger simulator (37-96 months child)
• Infant finger simulator (0-36 months infant)
• Material
• Conductive metal (resistance ≤ 0.1Ω; corrosion-resistant)
• Conductive metal (resistance ≤ 0.1Ω; corrosion-resistant)
• Handle Material
• Insulated ABS plastic (resistance ≥ 100MΩ; heat-resistant up to 110°C)
• Insulated ABS plastic (resistance ≥ 100MΩ; heat-resistant up to 110°C)
• Joint Characteristics
• 1 flexible pivot joint; max bending angle: 90° ± 10°
• 1 flexible pivot joint; max bending angle: 90° ± 10°
• – Tip Diameter: 8.6mm ± 0.1mm
• – Tip Diameter: 5.6mm ± 0.1mm
• – Total Length: 451.6mm ± 0.8mm
• – Total Length: 464.3mm ± 0.8mm
• – Collar Length: 101.6mm ± 0.3mm
• – Collar Length: 101.6mm ± 0.3mm
• Applied Thrust
• 10N ± 0.5N (mimics child’s curious contact force)
• 10N ± 0.5N (mimics infant’s grip force)

Applications

• 1. Testing plastic toy enclosure gaps (per EN 71-1:2020 Figure 8.2) to block infants’ (Probe 19) access to small internal parts.
• 2. Verifying household fridge door handle slots (compliant with IEC 60335-1:2023) to prevent young children (Probe 18) from touching cooling system wiring.
• 3. Safety checks for children’s learning tablet charging ports (per UL 60950-1:2023) to avoid infant (Probe 19) contact with live terminals.
• 4. Quality control for baby monitor casing seams during manufacturing, ensuring IEC 61032 compliance for infant safety.
• 5. Post-production testing of children’s ride-on toy control gaps (Probe 18) to meet global child equipment safety standards.
• IEC 61032 Small Finger Probe with Standard
• IEC 61032 Small Finger Probe with Standard
• The probe with cable, and can connect to SC-CT02 Low-voltage Test Supply Power 42V power supply

  https://iectesting.com/low-voltage-test-supply-power-electric-contact-indicator.html

Test procedure

1. 1. Inspect both probes for loose joints, bent tips, or cracked insulation; confirm conductivity with a test tool.
2. 2. Power on the child-accessible device under test (EUT, e.g., a toy or fridge) and set it to normal mode.
3. 3. Hold the insulated handle, use the joint to guide the relevant probe (18 for children, 19 for infants) into EUT openings (e.g., toy seams, fridge door gaps).
4. 4. Apply a steady 10N thrust to advance the probe—stop if resistance from the EUT blocks insertion.
5. 5. Check the connected live-part detector for signals (indicating contact with hazardous parts).
6. 6. Record results: Pass if no contact; Fail if the probe reaches dangerous components.

Product pictures

Standard drawing