IEC 61032 Figure 2 Test Probe B Jointed Test Finger SC-F2B

IEC 61032 Test Probe B jointed test finger SC-F2B product picture

SC-F2B  IEC 61032 Figure 2 Test Probe B

Product overview

The IEC 61032 Figure 2 Test Probe B (Jointed Test Finger) is a precision safety tool designed to simulate human finger movement for testing access to hazardous live parts in electrical/electronic equipment—from household appliances to industrial control panels. Its dual-jointed design bends 90° (±10°) in the same plane and direction, mimicking natural finger flexibility to navigate gaps rigid probes can’t reach. A 50 mm diameter baffle plate prevents over-insertion, while the 12 mm knurled metal tip detects live components. Crafted from conductive stainless steel (for durability/conductivity) and paired with an insulated handle, it applies gentle 10 N thrust—critical for validating safety and meeting global accessibility standards.

Applicable standard

IEC 61032 Figure 2; IEC 60529 Figure 1

Specifications

Standards IEC 61032 Figure 2; IEC 60529 Figure 1
Probe material Conductive stainless steel (resistance ≤ 0.1Ω, corrosion-resistant, knurled tip for consistent contact)
Handle material Insulated ABS plastic (resistance ≥ 100MΩ, heat-resistant up to 120°C, ergonomic grip for precision)
Joint characteristics 2 pivot joints; max bending angle 90° ±10° (same plane/direction); no deformation under 10N thrust
Knurled finger diameter 12 mm ± 0.1 mm
Knurled finger length 80 mm ± 0.2 mm
Baffle plate diameter 50 mm ± 0.2 mm
Baffle plate thickness 20 mm ± 0.1 mm
Baffle plate length 100 mm ± 0.2 mm
Total length (probe + handle) 300 mm ± 0.5 mm
Applied thrust 10 N ± 0.5 N

 

Test procedure

  1. Inspect the probe for loose joints, bent tips, or cracked insulation; confirm conductivity with a test tool.
  2. Power on the equipment under test (EUT) and set it to normal operating mode.
  3. Hold the insulated handle, use the joints to guide the 12 mm tip into EUT gaps (vents, panel seams, control slots).
  4. Apply steady 10 N thrust—stop if the 50 mm baffle touches the EUT or resistance blocks insertion.
  5. Check the connected live-part detector for signals (indicating contact with hazardous parts).
  6. Record results: Pass if no contact; Fail if the probe reaches dangerous components.

Applications

  1. Testing access to live wiring in household refrigerators (per IEC 61032:2017 Figure 2) to prevent electric shock.
  2. Verifying control panel gaps in office printers to block finger contact with circuits.
  3. Safety checks for industrial control box seams to avoid exposure to high-voltage terminals.
  4. Quality control for electric washing machines during manufacturing, ensuring UL 60335-1:2023 compliance.
  5. Post-production testing of small medical devices (e.g., blood pressure monitors) to validate hazardous part accessibility.

The probe with cable, and can connect to SC-CT02 Low-voltage Test Supply Power 42V power supply

Low-voltage Test Supply Power Electric Contact Indicator 42V power supply SC-CT02

 

Core function

Mimics finger movement to test access to hazardous live parts; prevents over-insertion via the 50 mm baffle plate; ensures compliance with the applicable standard.

Construction

  • Conductive stainless steel probe tip, knurled for consistent contact, resistance ≤ 0.1Ω
  • Insulated handle, resistance ≥ 100MΩ, heat-resistant up to 120°C
  • 2 (or 1) articulated pivot joints, max bending 90°, no deformation under 10 N thrust
  • 50 mm diameter baffle plate to prevent over-insertion
  • Body engraved with the standard designation and the model number
  • Supplied with a calibration certificate

Product pictures

IEC 61032 Test Probe B jointed test finger SC-F2B product picture
SC-F2B IEC 61032 Test Probe B jointed test finger – product picture 1
IEC 61032 Test Probe B jointed test finger SC-F2B product picture
SC-F2B IEC 61032 Test Probe B jointed test finger – product picture 2
IEC 61032 Test Probe B jointed test finger SC-F2B product picture
SC-F2B IEC 61032 Test Probe B jointed test finger – product picture 3
IEC 61032 Test Probe B jointed test finger SC-F2B product picture
SC-F2B IEC 61032 Test Probe B jointed test finger – product picture 4
IEC 61032 Test Probe B jointed test finger SC-F2B product picture
SC-F2B IEC 61032 Test Probe B jointed test finger – product picture 5

Standard drawing

IEC 61032 Figure 2 Test Probe B standard drawing SC-F2B
IEC 61032 Figure 2 / SC-F2B Test Probe B standard drawing

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