IP Test Probe Kit IP1X/2X/3X/4X/20C IEC 60529 Test Probe Set SC-60529K1

SC-F1A IEC61032 test probe sc-f1a-1

IP Test Probe Kit IP1X/2X/3X/4X/20C IEC 60529 Test Probe Set SC-60529K1

Product information:

An IP test probe kit is the set of access probes and object probes used to check the degrees of protection provided by an enclosure: protection of persons against access to hazardous parts (the first characteristic digit, IP1X to IP4X) and protection of the equipment against ingress of solid foreign objects. The kit below covers the IP1X, IP2X, IP3X and IP4X test levels of IEC 60529, with probe geometries taken from IEC 61032 (test probes A, B, 2, C and D).

Each probe is built with a stainless steel measuring part, an insulating handle and, where the standard requires it, a guard or stop face that limits how far the probe may enter an opening. For the anti-electric-shock test the probe can be supplied with an amphenol connector or banana plug so that it can be wired into a low-voltage signal circuit (supply plus indicator lamp) together with the hazardous part inside the enclosure; for the enclosure protection test the handle end is provided with an M6 threaded hole for a push and pull gauge.

Kit composition and test forces

IP level Probe Model Standard Test force Application
IP1X Access probe – sphere 50 mm dia. SC-F1A-F IEC 61032 Fig.1 / IEC 60529 50 N ±10% Protection against access to hazardous parts (back of hand) and against solid foreign objects ≥50 mm
IP2X Access probe – jointed test finger SC-F2B-F IEC 61032 Fig.2 / IEC 60529 10 N ±10% Protection against access to hazardous parts with a finger
IP2X Object probe – sphere 12.5 mm dia. SC-F62-F IEC 61032 Fig.6 / IEC 60529 30 N ±10% Protection against ingress of solid foreign objects ≥12.5 mm
IP3X Access / object probe – test rod 2.5 mm dia. SC-F3C-F IEC 61032 Fig.3 / IEC 60529 3 N ±10% Protection against access with a tool and against solid foreign objects ≥2.5 mm
IP4X Access / object probe – test wire 1.0 mm dia. SC-F4D-F IEC 61032 Fig.4 / IEC 60529 1 N ±10% Protection against access with a wire; also used for IP5X / IP6X tests against hazardous parts

Product pictures:

SC-F1A-F IEC61032 test probe sc-f1a-f-2
IEC61032 Figure 1 Test probe A – IP1X 50mm sphere (SC-F1A-F)
SC-F2B-F IEC61032 test probe sc-f2b-f-7
IEC61032 Figure 2 Test probe B – IP2X jointed test finger (SC-F2B-F)
SC-F62-F IEC61032 test probe sc-f62-f-1
IEC61032 Figure 6 Test probe 2 – IP2X 12.5mm sphere (SC-F62-F)
SC-F3C-F IEC61032 test probe sc-f3c-f-4
IEC61032 Figure 3 Test probe C – IP3X 2.5mm test rod (SC-F3C-F)
SC-F4D-F IEC61032 test probe sc-f4d-f-2
IEC61032 Figure 4 Test probe D – IP4X 1.0mm test wire (SC-F4D-F)

Standard drawings:

IEC61032 Figure 1 test probe A - standard drawing
IEC61032 Figure 1 test probe A – standard drawing
IEC61032 Figure 2 test probe B - standard drawing
IEC61032 Figure 2 test probe B – standard drawing
IEC61032 Figure 3 test probe C - standard drawing
IEC61032 Figure 3 test probe C – standard drawing
IEC61032 Figure 4 test probe D - standard drawing
IEC61032 Figure 4 test probe D – standard drawing

 

How to use the IP test probes

  • For the test of protection against access to hazardous parts on low-voltage equipment, connect a low-voltage supply in series with a suitable lamp between the probe and the hazardous parts inside the enclosure, then push the probe against (IP2X: insert into) every opening with the specified force.
  • For the test of protection against solid foreign objects, push the object probe against every opening with the specified force; the probe shall not pass through.
  • The protection is satisfactory if adequate clearance is kept between the access probe and the hazardous parts (the indicator lamp does not light) and if the full diameter of the object probe does not pass through any opening.

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